Finding a simple and convenient technique that combines nanoscale structural measurements and chemical identification has been an elusive goal. With current analytical instruments, spatial resolution is too low, signal-to-noise ratio too poor, sample preparation too complex or sample size too large to be of good service.Now, researchers at the University of Illinois have demonstrated a method for simultaneous structural and chemical characterization of samples at the femtogram level (a femtogram is one quadrillionth of a gram) and below.

The measurement technique combines the extraordinary resolution of atomic force microscopy and the excellent chemical identification of infrared spectroscopy. … Continue Reading »